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 (R)
ESDA6V1-4F1
A.S.D.TM
QUAD TRANSILTM ARRAY FOR ESD PROTECTION
APPLICATIONS Where transient overvoltage protection in ESD sensitive equipment is required, such as : Computers Printers Communication systems GSM handsets and accessories Other telephone sets Set top boxes
s s s s s s
3 A B
Z1 Z2
2
GND
1
Z3 Z4
GND
DESCRIPTION The ESDA6V1-4F1 is a 4-bit wide monolithic suppressor designed to protect against ESD components which are connected to data and transmission lines. It clamps the voltage just above the logic level supply for positive transients, and to a diode forward voltage drop below ground for negative transients. FEATURES
s s
Flip Chip (Bump side)
FUNCTIONAL DIAGRAM
A3
A2
A1
s
s
4 Unirectional transil functions Breakdown voltage: VBR = 6.1Vmin Low leakage current < 10 A Very low PCB space consuming
BENEFITS
s s
s
> 15kV ESD Protection High integration Suitable for high density boards
B3
B2
B1
ESD RESPONSE TO IEC61000-4-2 (air discharge 16kV, positive surge)
COMPLIES WITH THE FOLLOWING STANDARDS: - IEC61000-4-2: Level 4 15 kV (air discharge) 8 kV (contact discharge) - MIL STD 883E-Method 3015-6: class3 (Human body model)
July 2002 - Ed: 2A
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ESDA6V1-4F1
ABSOLUTE MAXIMUM RATINGS (Tamb = 25C) Symbol VPP Test conditions ESD discharge - MIL STD 883E - Method 3015-6 IEC61000-4-2 air discharge IEC61000-4-2 contact discharge Peak pulse power (8/20s) Junction temperature Storage temperature range Lead solder temperature (10 seconds duration) Operating temperature range Value 25 15 8 150 150 -55 to +150 260 -40 to +85 Unit kV
PPP Tj Tstg TL Top
W C C C C
ELECTRICAL CHARACTERISTICS (Tamb = 25C) Symbol VRM VBR VCL IRM IPP T C Rd VF Parameter Stand-off voltage Breakdown voltage Clamping voltage Leakage current Peak pulse current Voltage temperature coefficient Capacitance per line Dynamic impedance Forward voltage drop
Slope = 1/Rd
I
VCLVBR VRM IRM IR
V
IPP
VBR Type min.
@ max.
IR
IRM @ VRM max.
Rd typ. note 1
T max note 2 10-4/C 6
C max 0V bias pF 250
V ESDA6V1- 4F1 6.1
V 7.2
mA 1
A 10
V 5
m 350
Note 1: Square pulse IPP = 15A, tp = 2.5s Note 2: VBR = T * (Tamb - 25) * VBR(25C)
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ESDA6V1-4F1
Fig. 1: Peak power dissipation versus initial junction temperature
Ppp[Tj initial]/Ppp[Tj initial=25C] 1.1 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0.0
1000
Fig. 2: Peak pulse power versus exponential pulse duration (Tj initial = 25C)
Ppp(W)
100
Tj initial(C) 0 25 50 75 100 125 150 175
10 1
tp(s) 10 100
Fig. 3: Clamping voltage versus peak pulse current (Tj initial = 25C). Rectangular waveform tP = 2.5s.
Ipp(A) 50.0 10.0
Fig. 4: Capacitance versus reverse applied voltage (typical values).
C(pF) 250 225 200 175
F=1MHz Vosc=30mV
tp = 2.5s
1.0
150 125
Vcl(V)
100
20 25 30
VR(V) 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0
0.1
0
5
10
15
75 0.0
Fig. 5: Relative variation of leakage current versus junction temperature (typical values).
IR[Tj] / IR[Tj=25C] 1.8 1.6 1.4 1.2 Tj(C) 1.0 25 50 75 100 125 150
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ESDA6V1-4F1
CALCULATION OF THE CLAMPING VOLTAGE USE OF THE DYNAMIC RESISTANCE The ESDA6V1-4F1 has been designed to clamp fast spikes like ESD. Generally the PCB designers need to calculate easily the clamping voltage VCL. This is why we give the dynamic resistance in addition to the classical parameters. The voltage across the protection cell can be calculated with the following formula:
V CL = V BR + Rd I PP
Where IPP is the peak current through the ESDA cell. DYNAMIC RESISTANCE MEASUREMENT The short duration of the ESD has led us to prefer a more adapted test wave, as below defined, to the classical 8/20 s and 10/1000 s surges
I
IPP
t
2s 2.5 s 2.5 s duration measurement wave
As the value of the dynamic resistance remains stable for a surge duration lower than 20s, the 2.5s rectangular surge is well adapted. In addition both rise and fall times are optimised to avoid any parasitic phenomenon during the measurement of Rd. ESD PROTECTION WITH ESDA6V1-4F1 With the focus of lowering the operation levels, the problem of malfunction caused by the environment is critical. Electrostatic discharge (ESD) is a major cause of failure in electronic system. Transient Voltage Suppressors are an ideal choice for ESD protection and have proven capable in suppressing ESD events. They are capable of clamping the incoming transient to a low enough level such that damage to the protected semiconductor is prevented. Surface mount TVS arrays offer the best choice for minimal lead inductance. They serve as parallel protection elements, connected between the signal line to ground. As the transient rises above the operating voltage of the device, the TVS array becomes a low impedance path diverting the transient current to ground.
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ESDA6V1-4F1
Connector
ESDA6V1-4F1
The ESDA6V1-4F1 array is the ideal product for use as board level protection of ESD sensitive semiconductor components. The Flip Chip package makes the ESDA6V1-4F1 device some of the smallest ESD protection devices available. It also allows design flexibility in the design of "crowded" boards where the space saving is at a premium. This enables to shorten the routing and can contribute to improved ESD performance. LAYOUT RECOMMENDATIONS
Copper Pad Cu - Ni (2-6m) - Au (0.2m max) = 250m (300m max) 500m 500m
500m
O =320m max (stencil aperture) Solder paste Stencil Design thickness of 150m
Circuit board layout is a critical design step in the suppression of ESD induced transients. The following guidelines are recommended : The ESDA6V1-4F1 should be placed as close as possible to the input terminals or connectors. Minimise the path length between the ESD suppressor and the protected device Minimise all conductive loops, including power and ground loops The ESD transient return path to ground should be kept as short as possible. Use ground planes whenever possible.
s s s s s
IC
O =340m min (for 300m pad Non Solder mask opening
to
be
pr ot
ec ted
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ESDA6V1-4F1
PACKAGE MECHANICAL DATA Flip Chip (all dimensions in m)
500
MARKING Die size: (1570 50) x (1070 50) Die height (including bumps): 650 40 Bump diameter: 315 50 Pitch: 500 50
1070
500
(R)
EB
1570
MARKING Type ESDA6V1-4F1 Marking EB Delivery mode Tape & reel Order Code ESDA6V1-4F1 Base qty 5000
Note: For PCB design, assembly recommendations and packing information please refer to Application note AN1235. ("Flip-Chip: Package Description and recommendations for use")
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
The ST logo is a registered trademark of STMicroelectronics (c) 2002 STMicroelectronics - Printed in Italy - All rights reserved. STMicroelectronics GROUP OF COMPANIES Australia - Brazil - Canada - China - Finland - France - Germany Hong Kong - India - Israel - Italy - Japan - Malaysia - Malta - Morocco - Singapore Spain - Sweden - Switzerland - United Kingdom - United States. http://www.st.com 6/6
650


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